产品简介： 

neaSNOM是第三代散射式近场光学显微镜（简称s-SNOM），采用了专利化的散射式核心设计技术，极大的提高了光学分辨率，并且不依赖于入射激光的波长，能够在可见、红外和太赫兹光谱范围内，提供优于10nm空间分辨率的光谱和近场光学图像。 neaSNOM中采用专利的高阶解调背景压缩技术，能有效提取散射近场信号，在获得10nm空间分辨率的同时保持极高的信噪比，是目前世界上唯一成熟的s-SNOM产品。同时，其赝外差干涉式探测技术，能够获得对近场信号强度和相位的同步成像。由于其近场光学显微镜和谱图的可靠性和可重复性,neaSNOM也已成为纳米光学领域热点研究方向的首选科研设备，在等离基元、纳米FTIR和太赫兹等方向得到许多重要科研成果。

其技术特点和优势包括：

•  专利保护的散射式近场光学测量技术，独有的极高空间分辨率10nm

• 基于高稳定性的AFM系统，同时优化了纳米尺度下光学测量 

• 采用双光束设计，极高的光学接入角：水平放下180° & 垂直方向 60° 

• 专利保护的反射式光学系统，用于宽波长范围的光源：可见、红外以至太赫兹 

• 专利保护的干涉式近场信号探测单元

• 以极高的分辨率研究有机或无机样品，整个操作仅需要常规的AFM样品准备过程 

Near-Field Detection Module for Imaging (Transmission)

• Detection optimized for high performance near-field imaging in transmission-mode

• Enables optical amplitude and phase resolved near field measurements

• Patented background-free detection technology

• Enables bottom-side (transmission-mode) sample illumination with broadband mirror

• Suited for visible and infrared wavelength range 0.5 – 20 µm

• Requires transparent sample substrate

• Motorized parabolic mirror for easy beam-alignment in transmission-mode

• Stationary focal point with respect to AFM-tip

• Variable illumination spot size (ca. 2µm – 100µm)

• Suitable for plane-wave illumination

• Supported AFM scan-speed: up to 20 µm/s @ highest spatial resolution

  
  

Near-Field Detection Module for Spectroscopy (nano-FTIR)

• Reflective AFM-tip illumination

• Detection optimized for high-performance near-field spectroscopy

• Patented background-free detection technology

• Based on optimized Fourier-Transform spectrometer

• Up to 3 spectra per second

• Standard spectral resolution: 6.4/cm

• Upgrade to 3 cm-1  spectral resolution available

• Suited for visible & infrared detection (0.5 – 20 µm)

• Exchangeable beam-splitter mount included

• NEW: Suited for IR synchrotron sources